Friday 3rd of May 2024
 

Node Reliability in WDM Optical Network


Chinmayananda Panda, Surya Narayan Patro, Pradipta Kumar Das and Pradosh Kumar Gantayat

The Wavelength Division Multiplexing (WDM) technology has significantly enhanced the performance and reliability of optical components. Still failures occur. Due to the massive increase of bandwidth supported by fiber networks it becomes extremely important to identify the impact of individual failures may have on the network performance. Node failures in a WDM optical network result in a very high value of Call Drop Probability (CDP). In a backbone network, a node usually carries a huge amount of data and a low CDP is desirable. This paper focuses on understanding the different parameters that affect the reliability of optical networks with emphasis on failures caused due to the optical components comprising the network infrastructure. One algorithm has been developed for calculation of node reliability in WDM optical network. The algorithm is implemented in NSFNET (National Science Foundation Network), Ring and Mesh topology. The parameters affecting the Node Reliability of the optical network are presented, discussed and compared. The different scenarios under study are based on a national USA network topology i.e. NSFNET.

Keywords: Node Reliability, WDM, NSFNET

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ABOUT THE AUTHORS

Chinmayananda Panda
BE (CSE) , MTech (CSE) from Kalyani Govt Engineering College, WBUT ,West Bengal , INDIA

Surya Narayan Patro
MSc (Math), MTech (CSE), PhD in Computer Science from Utkal University , Vanivihar , Bhubaneswar, Orissa , INDIA

Pradipta Kumar Das
BE (CSE) , MTech (CSE) from Jadavpur University, West Bengal , INDIA

Pradosh Kumar Gantayat
BE (CSE) , MTech (CSE) from KIIT University, Bhubaneswar , Odisha , INDIA


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