Monday 16th of October 2017
 

Reliability Analysis of Modified Irregular Augmented Shuffle Exchange Network (MIASEN)


Shobha Arya and Nipur Singh

Multistage Interconnection Networks (MINs) play a vital role to accomplish high performance in the field of multiprocessing systems, parallel and distributed systems, networks-on-chips, broadband communications, and very large scale integration (VLSI) designs. Multistage Interconnection Networks are used to make a connection among memory elements and processing elements in high performance supercomputers and multiprocessing systems. The issue of reliability and fault tolerance, and cost effectiveness are the major challenges for counting the performance of MINs. A MIN is more reliable if it is able to handle the more faults encounter in different switching stages. In this paper, reliability of a MIN is investigated in terms of upper and lower bounds of Mean Time to Failure (MTTF) and a new network Modified Irregular Augmented Shuffle Exchange Network (MIASEN) has been proposed. The performance and comparison analysis shows that the proposed network is more reliable and fault tolerant than the existing Irregular Augmented Shuffle Exchange Network-2 (IASEN-2).

Keywords: Fault tolerance, reliability, multistage interconnection network

Download Full-Text


ABOUT THE AUTHORS

Shobha Arya
Research Scholar in Gurukul Kangri Vishwavidyalaya, Haridwar.

Nipur Singh
Professor in Gurukul Kangri Vishwavidyalaya, Haridwar.


IJCSI Published Papers Indexed By:

 

 

 

 
About IJCSI

IJCSI is a refereed open access international journal for scientific papers dealing in all areas of computer science research...

Learn more »
Join Us
FAQs

Read the most frequently asked questions about IJCSI.

Frequently Asked Questions (FAQs) »
Get in touch

Phone: +230 911 5482
Email: info@ijcsi.org

More contact details »